Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction; X-Ray, Electron and Ion Spectrometry; Electron Microscopy
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Book Details
Author(s)J. P. Eberhart
PublisherWiley
ISBN / ASIN0471929778
ISBN-139780471929772
Sales Rank15,245,706
CategoryTechnology & Engineering
MarketplaceUnited States 🇺🇸
Description ▲
An extraordinary development in techniques for studying and testing materials has occurred in recent years. Provides a basic knowledge of these material analysis methods. It is a comprehensive and coherent survey of the theory and practice of the most important of these techniques based on X-ray, electron and ion spectrometry, on the various imaging methods and electron microscopies, including scanning tunneling microscopy.
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