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Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction; X-Ray, Electron and Ion Spectrometry; Electron Microscopy

Author Eberhart, J. P.
Publisher Wiley-Blackwell
Category Technology & Engineering
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Book Details
ISBN / ASIN0471929778
ISBN-139780471929772
MarketplaceFrance 🇫🇷