Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction; X-Ray, Electron and Ion Spectrometry; Electron Microscopy
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Book Details
Author(s)Eberhart, J. P.
PublisherWiley-Blackwell
ISBN / ASIN0471929778
ISBN-139780471929772
CategoryTechnology & Engineering
MarketplaceFrance 🇫🇷