The EMMM-2007 Conference brought together leading experts in electron microscopy and materials modeling from around the world to explore how to synergistically combine atomic scale characterization and modeling to enhance the development of new materials.
Electron Microscopy and Multiscale Modeling - EMMM - 2007: An International Conference (AIP Conference Proceedings / Materials Physics and Applications)
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Book Details
PublisherAmerican Institute of Physics
ISBN / ASIN0735405190
ISBN-139780735405196
AvailabilityUsually ships in 24 hours
Sales Rank10,880,967
CategoryScience
MarketplaceUnited States 🇺🇸
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