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Principles of Semiconductor Network Testing (Test & Measurement)

Author Amir Afshar
Publisher Newnes
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Book Details
Author(s)Amir Afshar
PublisherNewnes
ISBN / ASIN0750694726
ISBN-139780750694728
AvailabilityUsually ships in 24 hours
Sales Rank836,353
MarketplaceUnited States 🇺🇸

Description

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Introduces a novel component-testing philosophy for semiconductor test, product and design engineers.
Best new source of information for experienced semiconductor engineers as well as entry-level personnel.
Eight chapters about semiconductor testing.