Search Books
International Conference on… Selected Papers on Halftone…

Fundamentals of Dimensional Metrology

Author Roger H. Harlow, Connie Dotson, Richard Thompson
Publisher Delmar Cengage Learning
Category Technology & Engineering
📄 Viewing lite version Full site ›
🌎 Shop on Amazon — choose country
99.95 262.95 USD
🛒 Buy New on Amazon 🇺🇸 🏷 Buy Used — $12.19

✓ Usually ships in 1-2 business days

Share:
Book Details
ISBN / ASIN0766820718
ISBN-139780766820715
AvailabilityUsually ships in 1-2 business days
Sales Rank1,873,835
MarketplaceUnited States 🇺🇸

Description

In modern industrial environments where responsibility for quality control is being placed upon individual workers, the understanding of dimensional metrology principles is becoming increasingly important. That's why the fourth edition of our best-selling Fundamentals of Dimensional Metrology book offers a direct path to understanding and applying the principles, techniques, and devices used within the dimensional metrology field today. This edition uses both the Metric and Imperial systems, yet emphasizes Metric measurement devices and concepts in all examples for greater consistency with the latest industry trends. Information on particular devices and concepts, previously presented in separate chapters, has been combined to improve the logical flow of the material. New chapter-end review questions have also been added to eliminate the potential for ambiguity, allowing readers to gauge their understanding as they progress through the book.
Fourth Dimension in Building: Strategies for Avoiding …
View
Design and Evaluation of Rigid and Flexible Pavements,…
View
Nuclear Nonproliferation: Status Of U.s. Efforts To Im…
View
Time-Domain Numerical Methods for Modelling Antennas, …
View
The Rise of the Standard Model: A History of Particle …
View
Synthesis, Properties and Crystal Chemistry of Perovsk…
View
Error Propagation in Environmental Modelling with GIS …
View
Crops And Environmental Change: An Introduction To Eff…
View
Multicarrier Modulation with Low PAR: Applications to …
View