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Digital Systems Testing & Testable Design

Author Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Publisher Wiley-IEEE Press
Category Technology & Engineering
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143.65 194.00 USD
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Book Details
ISBN / ASIN0780310624
ISBN-139780780310629
AvailabilityUsually ships in 24 hours
Sales Rank1,316,069
MarketplaceUnited States 🇺🇸

Description

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
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