Characterization of Semiconductor Materials, Volume 1: Principles and Methods (Volume 1)
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Book Details
Author(s)McGuire, Gary F.
PublisherWilliam Andrew
ISBN / ASIN0815512007
ISBN-139780815512004
MarketplaceFrance 🇫🇷
Description ▲
Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.