Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.
Scan Statistics: Methods and Applications (Statistics for Industry and Technology)
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Book Details
PublisherBirkhäuser
ISBN / ASIN0817647481
ISBN-139780817647483
AvailabilityUsually ships in 2 to 3 weeks
Sales Rank3,971,799
CategoryMathematics
MarketplaceUnited States 🇺🇸
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