Integrated Circuit Metrology, Inspection and Process Control IX: 20-22 February 1995, Santa Clara, California (Proceedings / SPIE--the International Society for Optical Engineering)

Name: Integrated Circuit Metrology, Inspection and Process Control IX: 20-22 February 1995, Santa Clara, California (Proceedings / SPIE--the International Society for Optical Engineering)
ISBN: 9780819417879

Publisher SPIE Press

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Book Details

PublisherSPIE Press

ISBN / ASIN0819417874

ISBN-139780819417879

AvailabilityIn stock. Usually ships within 2 to 3 days.

Sales Rank99,999,999

MarketplaceUnited States 🇺🇸

Integrated Circuit Metrology, Inspection and Process Control IX: 20-22 February 1995, Santa Clara, California (Proceedings / SPIE--the International Society for Optical Engineering)

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