- Background and Operating Principles
- Key Components of the Instrument
- Main Applications of STM and AFM
- Advanced Research Applications
Selected Papers on Scanning Probe Microscopes: Design and Applications (SPIE Milestone Series Vol. MS107)
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Book Details
Author(s)Yves Martin
PublisherSPIE Press
ISBN / ASIN0819418048
ISBN-139780819418043
AvailabilityUsually ships in 24 hours
Sales Rank12,423,409
MarketplaceUnited States 🇺🇸
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