Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays (SPIE proceedings series)

Name: Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays (SPIE proceedings series)
ISBN: 9780819422507

Publisher SPIE Press

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Book Details

PublisherSPIE Press

ISBN / ASIN0819422509

ISBN-139780819422507

Sales Rank99,999,999

MarketplaceUnited States 🇺🇸