Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV: 23-24 September, 1998, Santa Clara, California (Spie Proceedings Series)

Name: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV: 23-24 September, 1998, Santa Clara, California (Spie Proceedings Series)
ISBN: 9780819429698

Publisher SPIE-International Society for Optical Engine

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Book Details

PublisherSPIE-International Society for Optical Engine

ISBN / ASIN0819429694

ISBN-139780819429698

Sales Rank14,296,230

MarketplaceUnited States 🇺🇸

Description ▲

A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.