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Analysis of Sampled Imaging Systems (SPIE Tutorial Texts in Optical Engineering Vol. TT39)

Author Richard H. Vollmerhausen, Ronald G. Driggers
Publisher SPIE Publications
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Book Details
ISBN / ASIN0819434892
ISBN-139780819434890
AvailabilityUsually ships in 24 hours
Sales Rank3,274,658
MarketplaceUnited States 🇺🇸

Description

Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial's intended reader.

Contents

- Preface
- Introduction
- Fourier integral representation of an optical image
- Sampled imager response function
- Sampled imager design and optimization
- Interlace and Dither
- Dynamic Sampling, Resolution Enhancement, and Super-Resolution
- The Sampling Theorem
- Laboratory Measurements of Sampled Infrared Imaging System Performance
- Appendix A: Fourier integrals and Fourier series
- Appendix B: The impulse function