"Progress in Photothermal and Photoacoustic Science and Technology, Volume IV: Semiconductors and Electronic Materials (SPIE Press Monograph Vol. PM74)"

This volume, the fourth in a series on Photothermal and Photoacoustic Science and Technology (PPST), presents a comprehensive review of the diverse progress made in PPST of semiconductors and electronic materials during the 1990s. As with other volumes in the series, this text is useful as a reference for practicing scientists and engineers and as a supplement to upper level graduate courses in various areas of PPST and its subfields.

Contents

- Photothermal and Photoacoustic Characterization of Porous Silicon Structures
- The Peculiarities of Contrast Formation in Photoacoustic Microscopy of Semiconductors and the Role of the Stressed State
- Optical Detection of Photothermal Phenomena in Operating Electronic Devices: Temperature and Defect Imaging
- Photothermal Radiometric Study of Implanted Semiconductors
- Nonradiative Investigation of Impurity and Defect Levels in Si and GaAs by Piezoelectric Photoacoustic Spectroscopy (PPAS)
- Effect of the Confined Plasma on Thermal Wavefields in Semiconductor Devices
- Photothermal Characterization of Semiconductors
- Nonlinear Photoacoustic and Photothermal Phenomena in Semiconductors
- Carrier Transport Contribution to Thermoelastic and Electronic Deformation in Semiconductors
- Photothermal Spectroscopy of Ceramic and Nano-Crystal II IV Compound Semiconductors, Together with Ternary and Multinary Compounds