Many applications today require the Fourier-transform (FT) spectrometer to perform close to its limitations, such as taking many quantitative measurements in the visible and in the near infrared wavelength regions. In such cases, the instrument should not be considered as a perfect 'black box.' Knowing where the limitations of performance arise and which components must be improved are crucial to obtaining repeatable and accurate results. One of the objectives of this book is to help the user identify the instrument's bottleneck.
Contents
- Preface
- Spectroscopy Instrumentation
- Signal-to-Noise Ratio
- Principles of Interferometer Operation
- Interferometer Alignment Errors
- Motion Components and Systems
- Interferogram Data Sampling
- Data Acquisition
- The Detector
- Consideration of Optics and Interferometer Alignment
- Signal-to-Noise Ratio Enhancement Techniques
- Appendix A: Simulation of Static-Tilt Error
- Appendix B: Sampling Circuit Example
- Appendix C: Simulation of Sampling Error
- Index
