Two- and Three-dimensional Methods for Inspection and Metrology (SPIE Conference Proceedings)
📄 Viewing lite version
Full site ›
76.00
USD
🛒 Buy New on Amazon 🇺🇸
Book Details
Author(s)Kevin G. Harding
ISBN / ASIN0819460249
ISBN-139780819460240
MarketplaceUnited States 🇺🇸