Metrology, Inspection, and Process Control for Microlithography Xxiii (Proceedings of Spie)

Name: Metrology, Inspection, and Process Control for Microlithography Xxiii (Proceedings of Spie)
Author: John A. Allgair, Christopher J. Raymond
ISBN: 9780819475251

Author John A. Allgair, Christopher J. Raymond

Publisher Society of Photo Optical

📄 Viewing lite version Full site ›

🌎 Shop on Amazon — choose country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

230.00 USD

🛒 Buy New on Amazon 🇺🇸 🏷 Buy Used — $339.12

✓ Usually ships in 1 to 3 weeks

Book Details

Author(s)John A. Allgair, Christopher J. Raymond

PublisherSociety of Photo Optical

ISBN / ASIN0819475254

ISBN-139780819475251

AvailabilityUsually ships in 1 to 3 weeks

MarketplaceUnited States 🇺🇸