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Quantitative X-Ray Spectrometry

Author Ron Jenkins
Publisher Marcel Dekker Inc
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Book Details
Author(s)Ron Jenkins
ISBN / ASIN0824712668
ISBN-139780824712662
Sales Rank3,970,824
MarketplaceUnited States 🇺🇸

Description

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.