Search Books
Fundamentals of Circuit Ana… Basic Surveying

Engineering Properties of Foods, Third Edition (Food Science and Technology)

Publisher CRC Press
Category Technology & Engineering
📄 Viewing lite version Full site ›
🌎 Shop on Amazon — choose country
273.00 USD
🛒 Buy New on Amazon 🇺🇸 🏷 Buy Used — $60.00
Share:
Book Details
PublisherCRC Press
ISBN / ASIN0824753283
ISBN-139780824753283
Sales Rank7,172,528
MarketplaceUnited States 🇺🇸

Description

Ten years have passed since this reference s last edition making Engineering Properties of Foods, ThirdEditionthe must-have resource for those interested in food properties and their variations. Defined are food properties and the necessary theoretical background for each. Also evaluated is the usefulness of each property in the design and operation of important food processing equipment.

Of particular importance is that this latest edition offers seven new chapters many of which introduce information on groundbreaking new properties. These chapters, along with the inclusion of two revised chapters from previous editions, result in a text that offers nine out of sixteen chapters of new material.

This long-awaited third edition concentrates on a clear, comprehensive explanation of properties and their variations supplemented by abundant, representative information. By providing data in such a succinct and cogent manner, this comprehensive reference allows you to fully immerse in its depth and breadth of scope, while fully holding interest in the text.

Fourth Dimension in Building: Strategies for Avoiding …
View
Design and Evaluation of Rigid and Flexible Pavements,…
View
Nuclear Nonproliferation: Status Of U.s. Efforts To Im…
View
Time-Domain Numerical Methods for Modelling Antennas, …
View
The Rise of the Standard Model: A History of Particle …
View
Synthesis, Properties and Crystal Chemistry of Perovsk…
View
Error Propagation in Environmental Modelling with GIS …
View
Crops And Environmental Change: An Introduction To Eff…
View
Multicarrier Modulation with Low PAR: Applications to …
View