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Quantitative X-Ray Spectrometry, Second Edition, (Practical Spectroscopy)

Author Ron Jenkins, R. W. Gould, Dale Gedcke
Publisher Marcel Dekker
Category Science
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Book Details
PublisherMarcel Dekker
ISBN / ASIN0824795547
ISBN-139780824795542
AvailabilityUsually ships in 24 hours
Sales Rank4,066,373
CategoryScience
MarketplaceUnited States 🇺🇸

Description

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
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