Search Books
Gene Expression in Recombin… Applied Parameter Estimatio…

Quantitative X-Ray Spectrometry, Second Edition, (Practical Spectroscopy)

Author Ron Jenkins, R. W. Gould, Dale Gedcke
Publisher Marcel Dekker
Category Science
📄 Viewing lite version Full site ›
🌎 Shop on Amazon — choose country
287.00 USD
🛒 Buy New on Amazon 🇺🇸 🏷 Buy Used — $141.07

✓ Usually ships in 24 hours

Share:
Book Details
PublisherMarcel Dekker
ISBN / ASIN0824795547
ISBN-139780824795542
AvailabilityUsually ships in 24 hours
Sales Rank4,066,373
CategoryScience
MarketplaceUnited States 🇺🇸

Description

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
Studies on Cercospora and Allied Genera (Mycological P…
View
Gliomastix Gueguen (Mycological Paper)
View
A Revision of the Genus Ascotricha Berk (Mycological P…
View
Ustilaginales of the British Isles (Plant Science / Ho…
View
Witches' Broom Disease of Cacao (Phytopathological Pap…
View
The Concept of Vertical and Horizontal Resistance as I…
View
Sex, Drugs and Chocolate
View
Big Bang: The Origin of the Universe
View
Big Bang: The Origin of the Universe
View