Scanned Probe Microscopy. AIP Conference Proceedings, No. 241
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Book Details
PublisherAmerican Inst. of Physics
ISBN / ASIN0883188163
ISBN-139780883188163
AvailabilityUsually ships in 24 hours
Sales Rank14,440,356
MarketplaceUnited States 🇺🇸
Description ▲
Researchers in microscopy, practitioners in biology, materials science, engineering and physics.