Search Books
Water Resources Engineering Mechanics Machines Advanced…

Advanced Verification Topics

Author Bishnupriya Bhattacharya
Publisher lulu.com
Category Technology & Engineering
📄 Viewing lite version Full site ›
🌎 Shop on Amazon — choose country
60.00 USD
🛒 Buy New on Amazon 🇺🇸 🏷 Buy Used — $40.18

✓ Usually ships in 24 hours

Share:
Book Details
Publisherlulu.com
ISBN / ASIN1105113752
ISBN-139781105113758
AvailabilityUsually ships in 24 hours
Sales Rank2,195,605
MarketplaceUnited States 🇺🇸

Description

The Accellera Universal Verification Methodology (UVM) standard is architected to scale, but verification is growing and in more than just the digital design dimension. It is growing in the SoC dimension to include low-power and mixed-signal and the system integration dimension to include multi-language support and acceleration. These items and others all contribute to the quality of the SOC so the Metric-Driven Verification (MDV) methodology is needed to unify it all into a coherent verification plan. This book is for verification engineers and managers familiar with the UVM and the benefits it brings to digital verification but who also need to tackle specialized tasks. It is also written for the SoC project manager that is tasked with building an efficient worldwide team. While the task continues to become more complex, Advanced Verification Topics describes methodologies outside of the Accellera UVM standard, but that build on it, to provide a way for SoC teams to stay productive and profitable.
Fourth Dimension in Building: Strategies for Avoiding …
View
Design and Evaluation of Rigid and Flexible Pavements,…
View
Nuclear Nonproliferation: Status Of U.s. Efforts To Im…
View
Time-Domain Numerical Methods for Modelling Antennas, …
View
The Rise of the Standard Model: A History of Particle …
View
Synthesis, Properties and Crystal Chemistry of Perovsk…
View
Error Propagation in Environmental Modelling with GIS …
View
Crops And Environmental Change: An Introduction To Eff…
View
Multicarrier Modulation with Low PAR: Applications to …
View