High-Resolution X-Ray Scattering: From Thin Films To Lateral Nanostructures (Advanced Texts In Physics)
📄 Viewing lite version
Full site ›
Book Details
Author(s)Ullrich Pietsch
PublisherSpringer-Verlag New York Inc.
ISBN / ASIN1441923071
ISBN-139781441923073
AvailabilityHabituellement expédié sous 24 h
Sales Rank99,999,999
CategoryTechnology & Engineering
MarketplaceFrance 🇫🇷
Description ▲
Book by Pietsch Ullrich Holy Vaclav Baumbach Tilo
More Books in Technology & Engineering
Principles of Electric Circuits + Pass Code: Conventio…
View
Audel Hvac: Pocket Reference
View
Grain Storage Techniques: Evolution and Trends in Deve…
View
Advanced Digital Logic Design: Using Verilog, State Ma…
View
Steel Making
View
Field Safety: Participant Guide
View
The Water Works of Brooklyn: A Historical and Descript…
View
Project Mercury Familiarization Manual Manned Satellit…
View