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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

Publisher Springer
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Book Details
PublisherSpringer
ISBN / ASIN1441935746
ISBN-139781441935748
AvailabilityUsually ships in 24 hours
Sales Rank1,484,259
MarketplaceUnited States 🇺🇸

Description

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.