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Thermal and Power Managemen… Transient Analysis of Elect…

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Author Egerton, R.F.
Publisher Springer
Category Technology & Engineering
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Book Details
Author(s)Egerton, R.F.
PublisherSpringer
ISBN / ASIN1441938370
ISBN-139781441938374
Sales Rank3,295,598
MarketplaceUnited States 🇺🇸

Description

This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

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