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Electrothermal Analysis of VLSI Systems

Author Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo (Steve) Kang
Publisher Springer
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Book Details
PublisherSpringer
ISBN / ASIN1475773730
ISBN-139781475773736
AvailabilityUsually ships in 24 hours
Sales Rank13,588,674
MarketplaceUnited States 🇺🇸

Description

This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.