Supplement to IEEE Std 1491.1-1990, IEEE Standard Test Access Port and Boundary-Scan Architecture
📄 Viewing lite version
Full site ›
Book Details
Author(s)IEEE
PublisherInst of Elect & Electronic
ISBN / ASIN1559374977
ISBN-139781559374972
Sales Rank14,675,186
MarketplaceUnited States 🇺🇸