Radiation-induced Soft Errors: A Chip-level Modeling Perspective (Foundations and Trends(R) in Electronic Design Automation)

Radiation-induced Soft Errors: A Chip-level Modeling Perspective summarizes and discusses selected publications that enable a truly chip-level radiation-induced soft error rate estimation methodology. Although the strategies and concepts described have microprocessors manufactured in bulk CMOS technologies in mind, there is no fundamental reason why they cannot be applied to other technologies and different types of integrated circuits (ICs). Radiation-induced Soft Errors: A Chip-level Modeling Perspective starts by introducing the key strategy for modeling chip-level soft error rates (SER) used throughout the book. It goes on to discuss important types of single-event phenomena. The focus is mainly on radiation-induced phenomena that result in soft errors i.e., upsets that do not cause permanent damage. It continues to address the terrestrial particle environment and charge generation and collection processes. The next section summarizes SER trends of key SER contributors, while SER modeling methods are also discussed. It concludes by illustrating how all components can be put together in a truly chip-level capable SER strategy and tool. Radiation-induced Soft Errors: A Chip-level Modeling Perspective is an invaluable reference for anyone from academe or industry with an interest in this increasingly important topic.