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Design and Test Technology for Dependable Systems-on-Chip (Premier Reference Source)

Author Raimund Ubar
Publisher IGI Global
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Book Details
Author(s)Raimund Ubar
PublisherIGI Global
ISBN / ASIN1609602129
ISBN-139781609602123
AvailabilityUsually ships in 24 hours
Sales Rank4,669,678
MarketplaceUnited States 🇺🇸

Description

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences.

Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.