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PMP®/CAPM® EXAM PREP: A Basic Guide to Activity-On-Node and Critical Path Method

Author Jayanta K. Das Purkayastha
Publisher Booklocker.com, Inc.
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14.95 USD
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Book Details
ISBN / ASIN161434504X
ISBN-139781614345046
AvailabilityUsually ships in 24 hours
Sales Rank1,231,547
MarketplaceUnited States 🇺🇸

Description

A thorough and in-depth preparation guide for PMP® and CAPM® exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams.