ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009 San Jose McEnery Convention Center San Jose, California, USA

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.