ISTFA 2014, Proceedings from the 40th International Symposium for Testing and Failure Analysis
📄 Viewing lite version
Full site ›
Book Details
Author(s)ASM International
PublisherASM International
ISBN / ASIN1627080740
ISBN-139781627080743
AvailabilityUsually ships in 24 hours
Sales Rank1,822,431
MarketplaceUnited States 🇺🇸
Description ▲
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.