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ISTFA 2014, Proceedings from the 40th International Symposium for Testing and Failure Analysis

Author ASM International
Publisher ASM International
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Book Details
ISBN / ASIN1627080740
ISBN-139781627080743
AvailabilityUsually ships in 24 hours
Sales Rank1,822,431
MarketplaceUnited States 🇺🇸

Description

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.