ISTFA 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis
📄 Viewing lite version
Full site ›
Book Details
Author(s)ASM International
PublisherBrand: ASM International
ISBN / ASIN162708102X
ISBN-139781627081023
AvailabilityTemporarily out of stock.
MarketplaceUnited States 🇺🇸
Description ▲
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!