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Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy

Author José A. Gutierrez, Brian S.R. Armstrong
Publisher Springer
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149.00 USD
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Book Details
PublisherSpringer
ISBN / ASIN1849966745
ISBN-139781849966740
AvailabilityUsually ships in 24 hours
Sales Rank10,487,173
MarketplaceUnited States 🇺🇸

Description

This book addresses the problem of measurement error associated with determining the location of landmarks in images. The least possible photogrammetric uncertainty in a given situation is determined using the Cramér–Rao Lower Bound (CRLB).

The monograph provides the reader with: the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing; detailed theoretical treatment of the CRLB, and more.