Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)

Name: Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)
Author: Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp
ISBN: 9783642077852

Author Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp

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Book Details

Author(s)Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp

ISBN / ASIN3642077854

ISBN-139783642077852

MarketplaceUnited States 🇺🇸