Efficient circuit re-extraction for yield simulation applications (Research Report / SRC-CMU Research Center for Computer-Aided Design, Dept. of ... Engineering, Carnegie-Mellon University)
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Book Details
Author(s)Chew, Marko
ISBN / ASINB00071UEJ4
ISBN-13978B00071UEJ0
AvailabilityOut of Print--Limited Availability.
MarketplaceUnited States 🇺🇸