This digital document is an article from Harvard International Review, published by Harvard International Relations Council, Inc. on June 22, 2004. The length of the article is 2971 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.
Citation Details
Title: Does One size fit all? The International Patent regime.(International Trade)
Author: Graham Dutfield
Publication:Harvard International Review (Refereed)
Date: June 22, 2004
Publisher: Harvard International Relations Council, Inc.
Volume: 26 Issue: 2 Page: 50(5)
Distributed by Thomson Gale
Does One size fit all? The International Patent regime.(International Trade): An article from: Harvard International Review
📄 Viewing lite version
Full site ›
Book Details
Author(s)Graham Dutfield
ISBN / ASINB00082FY0Q
ISBN-13978B00082FY06
AvailabilityAvailable for download now
Sales Rank11,357,983
MarketplaceUnited States 🇺🇸