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Electrothermal Analysis of VLSI Systems

Author Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo (Steve) Kang
Publisher Springer
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Book Details
PublisherSpringer
ISBN / ASINB000QCQXQ2
ISBN-13978B000QCQXQ2
Sales Rank2,243,790
MarketplaceUnited States 🇺🇸

Description

This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.