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Reliability demonstration test planning: A three dimensional consideration [An article from: Reliability Engineering and System Safety]

Author O.P. Yadav, N. Singh, P.S. Goel
Publisher Elsevier
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Book Details
PublisherElsevier
ISBN / ASINB000RR9QH4
ISBN-13978B000RR9QH5
AvailabilityAvailable for download now
Sales Rank11,391,000
MarketplaceUnited States 🇺🇸

Description

This digital document is a journal article from Reliability Engineering and System Safety, published by Elsevier in 2006. The article is delivered in HTML format and is available in your Amazon.com Media Library immediately after purchase. You can view it with any web browser.

Description:
Increasing customer demand for reliability, fierce market competition on time-to-market and cost, and highly reliable products are making reliability testing more challenging task. This paper presents a systematic approach for identifying critical elements (subsystems and components) of the system and deciding the types of test to be performed to demonstrate reliability. It decomposes the system into three dimensions, (i.e. physical, functional and time) and identifies critical elements in the design by allocating system level reliability to each candidate. The decomposition of system level reliability is achieved by using criticality index. The numerical value of criticality index for each candidate is derived based on the information available from failure mode and effects analysis (FMEA) document or warranty data from a prior system. It makes use of this information to develop reliability demonstration test plan for the identified (critical) failure mechanisms and physical elements. It also highlights the benefits of using prior information in order to locate critical spots in the design and in subsequent development of test plans. A case example is presented to demonstrate the proposed approach.