IEC 61000-4-20 Ed. 1.0 b:2003, Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe + TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations (EUT = equipment under test); + TEM waveguide validation methods for EMC measurements; + the EUT (i.e. EUT cabinet and cabling) definition; + test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and + test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.