Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach: 1st (First) Edition

Name: Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach: 1st (First) Edition
Author: Edward B. Hakim, Michael Pecht Pradeep Lall
ISBN: 978B0086PULS6

Author Edward B. Hakim, Michael Pecht Pradeep Lall

Publisher CRC Press

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Book Details

Author(s)Edward B. Hakim, Michael Pecht Pradeep Lall

PublisherCRC Press

ISBN / ASINB0086PULSC

ISBN-13978B0086PULS6

MarketplaceFrance 🇫🇷