Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicolici, Nicola, Al-Hashimi, Bashir M. (2003) Hardcover

Name: Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicolici, Nicola, Al-Hashimi, Bashir M. (2003) Hardcover
Author: Nicola, Al-Hashimi, Bashir M. Nicolici
ISBN: 978B00Z8FSNB8

Author Nicola, Al-Hashimi, Bashir M. Nicolici

Publisher Springer

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Book Details

Author(s)Nicola, Al-Hashimi, Bashir M. Nicolici

PublisherSpringer

ISBN / ASINB00Z8FSNBA

ISBN-13978B00Z8FSNB8

MarketplaceUnited Kingdom 🇬🇧

Description ▲

2003