Digital Circuit Testing and Testability (The Morgan Kaufmann Series in Computer Architecture and Design) by Parag K. Lala (1997-01-28)

Name: Digital Circuit Testing and Testability (The Morgan Kaufmann Series in Computer Architecture and Design) by Parag K. Lala (1997-01-28)
Author: Parag K. Lala
ISBN: 978B01A64BYN7

Author Parag K. Lala

Publisher Academic Press; 1 edition (1997-01-28)

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Book Details

Author(s)Parag K. Lala

PublisherAcademic Press; 1 edition (1997-01-28)

ISBN / ASINB01A64BYN6

ISBN-13978B01A64BYN7

MarketplaceFrance 🇫🇷