CSN EN 61967-8 - Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

Name: CSN EN 61967-8 - Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Author: METROLOGY AND TESTING CZECH OFFICE FOR STANDARDS
ISBN: 978B01FXB2OY3

Author METROLOGY AND TESTING CZECH OFFICE FOR STANDARDS

Publisher CZECH OFFICE FOR STANDARDS, METROLOGY AND TESTING

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Book Details

Author(s)METROLOGY AND TESTING CZECH OFFICE FOR STANDARDS

PublisherCZECH OFFICE FOR STANDARDS, METROLOGY AND TESTING

ISBN / ASINB01FXB2OYA

ISBN-13978B01FXB2OY3

MarketplaceUnited Kingdom 🇬🇧

Description ▲

EN 61967-8 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method - IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This publication is to be read in conjunction with IEC 61967-1:2002.Original English text of CSN EN Standard.The price of the Standard included all amendments and correcturs.