Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) by Wayne B. Nelson (1990-02-23)
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Book Details
Author(s)Wayne B. Nelson
PublisherWiley-Interscience
ISBN / ASINB01NANDC3Z
ISBN-13978B01NANDC30
Sales Rank99,999,999
MarketplaceUnited States 🇺🇸