VLSI Test Principles and Architectures: Design for Testability

VLSI Test Principles and Architectures A comprehensive guide to DFT methods that shows the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. It provides coverage of design for testability. It presents coverage of industry practices commonly found in commercial DFT tools. Full description