https://www.ebooknetworking.net/books_detail-012373973X.html

System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability (Systems on Silicon)

Name: System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability (Systems on Silicon)
Author: Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
ISBN: 9780123739735

AuthorLaung-Terng Wang, Charles E. Stroud, Nur A. Touba

PublisherMorgan Kaufmann

Shop on Amazon — choose your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

Buy New on Amazon 🇮🇳

Book Details

Author(s)Laung-Terng Wang, Charles E. Stroud, Nur A. Touba

PublisherMorgan Kaufmann

ISBN / ASIN012373973X

ISBN-139780123739735

MarketplaceIndia 🇮🇳