Arithmetic Built-In Self-Test for Embedded Systems

This book will introduce test and design engineers to new techniques that can be used to improve testing and quality of a wide range of circuits.This book explains what arithmetic built-in self-test (BIST) is, and how it can be used in a wide variety of circuits. It shows how BIST can support new design methodologies that rely on hardware/software co-design, DSP cores and embedded processors.Hardware/embedded system designers, test engineers, researchers working on IC/core testing, and graduate students.