Scanning Electron Microscopy and X-Ray Microanalysis
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Book Details
Author(s)
Robert Edward Lee
Publisher
Prentice Hall
ISBN / ASIN
0138137595
ISBN-13
9780138137595
Marketplace
France 🇫🇷
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Description
A clear description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, detectors, image construction, image processing, vacuum generation and energy and wavelength dispersive X-ray spectroscopy.
