Scanning Electron Microscopy and X-Ray Microanalysis
Book Details
Author(s)Robert Edward Lee
PublisherPrentice Hall
ISBN / ASIN0138137595
ISBN-139780138137595
MarketplaceFrance 🇫🇷
Description
A clear description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, detectors, image construction, image processing, vacuum generation and energy and wavelength dispersive X-ray spectroscopy.







