Electron Energy-Loss Spectroscopy in the Electron Microscope (The Language of Science)
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Book Details
Author(s)
R.F. Egerton
Publisher
Springer
ISBN / ASIN
0306452235
ISBN-13
9780306452239
Marketplace
France 🇫🇷
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Description
The Second Edition explores several new applications of EELS developed during the last ten years. Chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections.
